Яндекс.Метрика

Abstract

Resolution and stability analysis of offset VSP acquisition scenarios with applications to full-waveform inversion

РИНЦ РИНЦ EDN Dimensions DOI

I. Silvestrov, D. Neklyudov, V. Tcheverda, M. Puckett

Publication: SEG International Exhibition and 82nd Annual Meeting (Las Vegas, Nevada, USA, 4-9 November 2012 Mandalay Bay Convention Center)
Уear of publication: 2012
индекс в базе ИАЦ: 040368